BROOKLYN, N.Y., Nov. 9, 2016 /PRNewswire-USNewswire/ -- Researchers at the NYU Tandon School of Engineering have pioneered a method for growing an atomic scale electronic material at the highest quality ever reported. In a paper published in Applied Physics Letters, Assistant Professor of Electrical and Computer Engineering Davood Shahrjerdi and doctoral student Abdullah Alharbi detail a technique for synthesizing large sheets of high-performing monolayer tungsten disulfide, a synthetic material with a wide range of electronic and optoelectronic applications.
"We developed a custom reactor for growing this material using a routine technique called chemical vapor deposition. We made some subtle and yet critical changes to improve the design of the reactor and the growth process itself, and we were thrilled to discover that we could produce the highest quality monolayer tungsten disulfide reported in the literature," said Shahrjerdi. "It's a critical step toward enabling the kind of research necessary for developing next-generation transistors, wearable electronics, and even flexible biomedical devices."