BEAVERTON, Ore., Nov. 1, 2016 /PRNewswire/ -- Tektronix, Inc., a leading worldwide provider of measurement solutions, today announced the industry's first test solution for the Open NAND Flash Interface (ONFI) standard. Available for Tektronix high-performance oscilloscopes, the ONFI 4.0 test solution includes software for analyzing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
The ONFI standard is published by the ONFI Working Group to simplify the integration of NAND Flash memory into consumer electronics and computing platforms. The ONFI 4.0 spec introduces the evolutionary NV-DDR3 interface with VccQ = 1.2V operation for increased performance and improved power consumption, scales NV-DDR2 and NV-DDR3 I/O speed to 667 MT/s and 800 MT/s, and adds ZQ calibration functionality. As the speeds have increased and voltage levels have dropped, designers working with the ONFI bus face challenges to ensure compliance, debug timing problems and gain access to signals. TEK-PGY-ONFI software enables design and test engineers to test the ONFI interface for compliance to ONFI bus timing parameters and provides automated measurements of Command, Address, Data in and Data out transactions. A detail view feature in the TEK-PGY-ONFI software correlates each electrical measurement of an ONFI waveform by annotating it with the analog waveform to help debug timing problems.