Teradyne, Inc. (NYSE: TER) announced that EDN, part of UBM Tech's portfolio of communities for the electronics industry, has honored the J750Ex-HD with a 2014 Best in Test award. The winners are selected online by the EDN community. The J750Ex-HD, the newest addition to the J750 family, delivers breakthrough cost-of-test reduction and higher performance instrumentation tailored for testing consumer SOC applications at wafer sort/probe or final package test production insertions. "Teradyne’s J750™ platform has been the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices since it was introduced over 10 years ago," said Gregory Smith, vice president, SOC Marketing, Teradyne. "The J750Ex-HD builds on that success by bringing higher throughput along with digital and mixed signal capabilities to this reputable platform while maintaining compatibility. Teradyne thanks EDN and its readers for this honor." Teradyne began shipping the J750Ex-HD in Q2 2013 and has booked more than 50 system orders across 10 different customers. The J750Ex-HD includes system enhancements and new High Density (HD) instruments which can be ordered with new systems or as an upgrade on over 4,000 J750 and IP750 systems installed worldwide to seamlessly run existing or newly developed test programs. J750 test systems are widely available at more than 50 OSAT locations and supported by a complete set of production interface solutions for wafer sort and final test. For more information on the J750, visit www.teradyne.com/J750. AboutEDN EDN is an online community designed for electronics design engineers, developers, and industry-related management. EDN provides engineers with the technology trends and design-how-to information they need to keep pace in this fast-paced environment, as well as the networking, contacts, mentoring, and peer-to-peer knowledge opportunities needed to take an idea from concept to reality.