Aehr Test Systems Announces Multi-System ABTS(TM) Order From European Semiconductor Manufacturer

FREMONT, Calif., Jan. 9, 2014 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a new customer order of more than $1 million for multiple ABTS Burn-in and Test Systems from a European semiconductor manufacturer. The order includes down payments to lock in delivery slots and volume pricing discounts. As the order is for a configuration that is shipping in volume today, shipments are expected before the end of Aehr Test's fiscal 2014.

The ABTS systems will be used in the qualification and production of a wide variety of devices, including memories, microcontrollers and microprocessors. Qualification tests typically utilize a high-temperature operating life (HTOL) test, where failure mechanisms are accelerated by burning-in the devices for 1000 hours to confirm that the basic design and fabrication process of a device will meet the reliability targets over an extended period of normal use. Production burn-in is a much shorter stress to ensure that early-life failures are screened out before the devices are shipped to the end customer.

"We are very excited to see improved worldwide demand for our products, particularly in Europe, following the multi-year turndown that began during the global recession," said Mark Allison, vice president of sales at Aehr Test Systems. "This order for ABTS systems further demonstrates how reliability and quality needs of devices ranging from aerospace, automotive and mobility continue to drive the test and burn-in market."

The ABTS family of products is based on a hardware and software platform that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. The ABTS system can be configured with up to 72 burn-in boards with up to 320 I/O channels each and 32M of test vector memory per channel. The ABTS offers the option of high voltage Device Power Supplies configurable with programmable voltage ranges to 60 or 230 volts, which are needed for automotive and power-line applications. The ABTS system is optimized for use with the Sensata iSocket* and VTR Thermal Management Technologies, which provide a scalable cost-effective solution using individual device temperature control for ICs up to 75 watts or more. Individual temperature control enables high-power devices with a broad range of power dissipation to be burned-in simultaneously in a single burn-in chamber while maintaining a precise device temperature. The ABTS system also uses N+1 redundancy technology and hot-swap capability for many key components in the system to maximize system uptime.

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