This tool enables scanning HRXRD, XRR and (GI)XRD measurements. HRXRD is capable of measuring epitaxial layer composition, thickness, density, strain and relaxation of single and multi-layer stacks. Additionally, with XRR and (GI)XRD channels, the tool provides information on the thickness, density, phase and crystallinity of ultra-thin layers typically used in the FEOL process. Unlike optical or spectroscopic tools, the HRXRD and XRR are first principle techniques that deliver accurate and precise results without calibration.About Jordan Valley Semiconductors Ltd. http://www.jvsemi.com Jordan Valley Semiconductors (JVS), the leader in X-ray metrology and defect detection tools for the semiconductor industry. Jordan Valley's tools are fully automated non-contacting and non-destructive tools designed for production control on patterned or blanket wafers. The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology and defect inspection tools, based on X-ray technologies such as XRR (X-ray reflectomerty), XRF (X-ray fluorescence), XRD (X-ray diffraction) and others. Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE: CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE: ELRN).With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin TX, USA, Hsin-Chu Taiwan, Suwon Korea and other offices and sales representatives worldwide. For more information: Alon Kapel, Director of Sales & Marketing Jordan Valley Semiconductors Ltd. Tel: +972-4-654-3666 x 134 email@example.com SOURCE Jordan Valley Semiconductors Ltd.