Wide-Band Analysis System TAS7500SU■ Improved High-Frequency Coverage Enables Diverse Terahertz Research Applications Advantest’s Cherenkov THz radiation source* enables higher-frequency terahertz wave generation, giving the TAS7500SU an analysis range of 0.5 – 7.0 THz, compared to the 0.1 - 4THz range of the previous TAS7500SP system. This wider coverage facilitates diverse new analysis applications. ■ Industry-Best High-Speed Measurement Functionality The TAS7500 series boasts an industry-best scan time of 8 milliseconds, ensuring speedy measurement results unaffected by exterior changes in humidity and temperature. * Advantest’s new Cherenkov THz radiation source, which generates a superior range of frequencies, was announced in September 2012, as was the company’s terahertz time-of-flight (TOF) tomography analysis system, which employs the Cherenkov radiation source. Low-Frequency Analysis System TAS7500SL ■30GHz-2THz Analysis Range Optimal for Terahertz Wireless Communications Materials Development, Other Applications In the field of terahertz wireless communications—a technology expected to find practical applications in the near future—it is crucial for engineers to accurately analyze the characteristics of the materials they work with, such as permittivity and absorptiveness. The TAS7500SL is specialized for the 30GHz – 2THz band of the spectrum, optimizing it for R&D in the area of materials to be used for packages, boards, and other communications components, as well as spectroscopic analysis at these bandwidths. Transmittance Polarization Analysis Module ■ Measurement of Crystalline & Molecular Structures Provides More Detailed Analysis Results Advantest’s new transmittance polarization analysis module, which can be mounted on the TAS7500SP, enables polarization analysis of anisotropic optical materials, among others, via polarization characteristics measurement, thus providing more detailed analysis results. ■ Easy Operation Boosts Efficiency In common with Advantest’s existing spectroscopic measurement modules (transmission, reflection, and ATR), the new transmittance polarization analysis module is easy to install and remove, aiding ease of operation in any measurement environment.
For more information:TAS Project email@example.com TEL：+81-22-392-8730 Advantest will exhibit at SPIE Photonics West at the Moscone Center, San Francisco on February 5-7, 2013. About Advantest Corporation A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.