ALISO VIEJO, Calif., Oct. 11, 2012 /PRNewswire/ -- Microsemi Corporation (Nasdaq: MSCC), a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today announced its TRRUST-Stor ™ solid state drive (SSD) earned the prestigious Editor's Choice award from Military Embedded Systems magazine. Microsemi's highly secure TRRUST-Stor SSD includes hardware-implemented AES encryption with a 256-bit key using the XTS block cipher mode and additional security features that render data forensically unrecoverable in less than 30 milliseconds. (Logo: http://photos.prnewswire.com/prnh/20110909/MM66070LOGO) "TRRUST-Stor drive is arguably the most secure solid state drive on the market today and we are honored to have earned Military Embedded Systems' Editor's Choice award for this innovative solution," said BJ Heggli, vice president of strategic development and assistant general manager for Microsemi. "Microsemi has a long and proven track record of providing security solutions for military and industrial applications. We are increasing our focus and investment in this important segment and will continue to drive innovations that help our customers protect critical data and design information." Microsemi's security solutions portfolio includes field programmable gate arrays (FPGAs), system-on-chip (SoCs) products, cryptography solutions, TRRUST-Stor SSDs, intellectual property (IP) and firmware. The company also offers a comprehensive range of anti-tamper services, as well as design, assembly, packaging and testing services all in its trusted facility. About TRRUST-Stor In addition to AES 256-bit encryption, Microsemi's TRRUST-Stor SSD features sanitization protocols, Microsemi's proprietary Armor ™ processor and TRRUST-Purge ™ technology. The proprietary SSD design provides superior data integrity and endurance by focusing processing power on error correction, wear leveling, and eliminating drive corruption and unscheduled downtime. This failure prevention methodology protects data from catastrophic failures in critical applications and provides an essential layer of protection.