Advantest’s T5773 NAND Flash Tester Captures Test & Measurement World’s Best In Test Award
Advantest Corporation (TSE: 6857, NYSE: ATE) announces that Test &
Measurement World Magazine has awarded its prestigious 2012 Best in Test
Award in the Semiconductor Test category to Advantest’s T5773 NAND Flash
Advantest Corporation (TSE: 6857, NYSE: ATE) announces that Test & Measurement World Magazine has awarded its prestigious 2012 Best in Test Award in the Semiconductor Test category to Advantest’s T5773 NAND Flash Tester. The annual competition recognizes innovations that have made an especially significant contribution to the test industry. Product finalists were selected by the editors of Test & Measurement World magazine, with voting performed by the publication’s readership. The award winners were named during a ceremony held in conjunction with DesignCon 2012 on January 31, 2012, in Santa Clara, CA. Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use. “We are honored to receive this prestigious award from Test & Measurement World magazine and equally grateful to our customers and industry peers who gave their support to the voting process. As the flash market grows with demand for smartphones, tablets, laptops and other PDAs, it is rewarding to know that the T5773 NAND Flash Tester is so highly regarded and is contributing to our customers’ business success,” commented Keith Lee, president and CEO of Advantest America, Inc. About Advantest Corporation A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com. About Test & Measurement World Magazine Test & Measurement World serves the information needs of engineers in the electronic original equipment market (EOEM), which includes manufacturers of test equipment, medical equipment, aircraft and aerospace, automotive, consumer electronics, and other products and services, as well as engineers in the electronic test, measurement, and inspection industries. Engineers can access technical information geared for on-the-job application, as well as industry news, coverage of the latest standards and technologies, application notes, product specifications, how-to articles, industry events, blogs, and contests. Over 60,000 individuals in engineering management, engineering technical/staff, and corporate and general management rely on Test & Measurement World to keep them up-to-date on current developments, regulatory requirements, trends, and innovations in the test and measurement marketplace.