SAN FRANCISCO, Jan. 11, 2012 /PRNewswire/ -- UBM Electronics, a UBM company and the daily source of essential business and technical information for the electronics industry's decision makers, has announced new programs added to the 100+ sessions for DesignCon 2012, to be held in Santa Clara, Calif., January 30 through February 2, 2012. As part of the 14 tracks that include technical paper presentations, tutorials, sponsored training sessions, and keynote addresses, show organizers will present a panel entitled "Delivering on Time-to-Answer: Meeting Designers Needs in Test and Measurement," as well as newly announced product teardowns. Taking place on Wednesday, February 1 from 3:45pm to 5:00 p.m., the test and measurement panel will be moderated by Patrick Mannion, director of content, UBM Electronics, and speakers who will discuss the nature of test, the interactions and issues designers face, how test technology is evolving to meet designers' needs and what to anticipate next. "Designers face ever-shorter time-to-market windows and consistently look to their test equipment for faster 'time to answer'," said Mannion. "Yet this requirement clearly flies in the face of the increasing complexity required in these systems. This panel pulls together the best minds in the industry to explore how these conflicting trends can be resolved..." Panel speakers include Greg Peters, VP and general manager of Agilent's Component Test Division (CTD), which products include vector network analyzers, device test instruments and test accessories; David Graef, VP and chief technology officer of LeCroy Corporation; and Kevin Ilcisin, chief technology officer of Tektronix Corporation. The panel rounds out the busy schedule of the only Silicon Valley eventthat addresses the chip, system and package challenges of high-speed design faced by both board designers and chip design engineers.