Agilent Technologies, Inc. (NYSE:A) today reinforced its position as an innovator in atomic spectroscopy with the introduction of the
Agilent 5100 Inductively Coupled Plasma – Optical Emission Spectrometer (ICP-OES)
. The new system enables customers to run samples faster, using less gas and without compromising performance on even the toughest samples. The new instrument is ideal for labs doing food, environmental and pharmaceuticals testing as well as mining and industrial applications.
“Already the performance leader in ICP-OES, Agilent has raised the bar with a system that sidesteps the usual compromises in speed and robustness associated with dual-view analysis,” said Philip Binns, Agilent’s vice president of spectroscopy products.
While conventional dual-view systems require up to four sequential measurements per sample, the Agilent 5100 requires only one, thanks to its innovative Dichroic Spectral Combiner and Synchronous Vertical Dual-view technologies. These innovations will enable customers to perform their analyses with greater speed, accuracy and ease, saving them time and money.
“Agilent’s aim has always been to supply the fastest, highest performance atomic spectroscopy systems capable of running the toughest samples,” said Binns. “This year—with the launch of the
and now the
—we continue to lead the way in elemental analysis innovation, demonstrating our ongoing commitment to providing our customers with the best tools to meet their application needs.”
Binns noted that the Agilent 5100 ICP-OES runs analyses 55 percent faster using 50 percent less gas per sample than competitive systems. “No other system on the market can match the performance—or the low cost of ownership—of the new 5100,” he said.
With the new system, customers will be able take the guesswork out of method development with intuitive ICP Expert software and Dichroic Spectral Combiner technology. They can also capture all wavelengths in one measurement for higher precision without delays. The system’s vertical torch will enable them to measure even the most challenging samples—from high matrix to volatile organic solvents—with a high degree of confidence.