March 3, 2014
/PRNewswire/ -- Today at Pittcon 2014, Texas Instruments (TI) (NASDAQ: TXN) announced the first DLP
device optimized for use with near infrared (NIR) light, and corresponding evaluation module (EVM). Together, the
EVM represent the expansion of TI's award-winning MEMS technology into the worlds of transmittance and reflective spectroscopy and other markets. With DLP technology, spectrometers for use in the food, pharmaceutical, oil and gas, and emerging industries will be able to deliver lab-quality performance out in the field and on the manufacturing line. Learn more at
"Incorporating DLP technology into our range of OEM spectrometers revolutionizes our approach to classical spectroscopy," said
Henrik Skov Andersen
, CEO and President, Ibsen Photonics. "Our new compact programmable polychromator with DLP technology allows pre-dispersive selection of multiple wavelengths for high-speed transmission or absorption measurements, using inexpensive broadband detectors across the VIS-NIR ranges. That unique ability will enable customers to generate dynamic measurement schemes and algorithms, gain speed and accuracy for critical applications, and protect samples from unnecessary exposure."
"We continue to push the limits of what DLP technology is capable of, opening it up for use in advanced scientific, industrial and medical solutions," said
, DLP Embedded manager at TI. "With the new, near infrared DLP platform, spectroscopy equipment designers will be able to develop a whole new class of mobile equipment that moves the sensitivity and accuracy of lab equipment to the field, while reducing their overall system cost."
The approximately one million digitally programmable micromirrors at the heart of DLP technology set the new DLP4500NIR device apart from other components and solutions currently available for NIR spectroscopy. When paired with a single element detector, the DLP4500NIR allows engineers to replace expensive linear detector arrays to create high-performance spectrometer designs, while reducing the typical bill of materials. Optimized for use with 700- to 2500-nm light, the DLP4500NIR can be programmed to select and attenuate multiple wavelengths at speeds up to 4 kHz. The DLP technology architecture also enables improved signal-to-noise ratios (SNRs) greater than 30,000:1 over a set measurement period for faster, more accurate results compared to spectrometers using traditional solutions.
Each of the micromirrors on the DLP4500NIR can be controlled to produce set patterns, with users able to further refine spectral resolution and wavelength ranges, adjust integration time, and equalize light throughput. As a result, users can employ adaptive scanning techniques to optimize material analysis on the fly for a broader range of substances using a single system.