- HSD800 Multifunction Instrument. A third generation digital instrument providing 128 high speed digital channels, scalable to 2,048 channels per system. The instrument also introduces DIB Access, an innovative feature allowing unique tester resources including High Voltage and Digital Source and Signal Capture (DSSC) pins, to be easily connected without external hardware. DIB Access reduces load board complexity, shortening time-to-market and simplifying concurrent test to increase overall test cell throughput.
- 72-channel HD CTO. A precision DC and analog instrument with graphical programming templates and debug tools to simplify converter testing and other precision DC measurements.
- IG-XL® 3.60 Software. Extends push button program scalability to 512 sites.
- Zero-footprint, Air-cooled System. Minimizes floor space.
- Compatible Operation. System Architecture maintains pin and program compatibility with existing J750Ex Device Programs.
New Teradyne J750Ex-HD Extends Teradyne’s Cost Of Test Leadership For SoC Devices
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