About the JVSensus™ semiconductors production metrology tool
The JVSensus is a fully automated X-ray transmission topography system; enable in-line detection of non visual crystalline defects on patterned or blanket 300mm or 450mm wafers. The system is based on over 15 years of experience in the area of X-ray topography and was designed for fully fab automation and automatic defect detection and classification. The system is based on the 2012 "Best of West" award winner QCTT tool.
About Jordan Valley Semiconductors Ltd. http://www.jvsemi.com
Jordan Valley Semiconductors (JVS), the leader in X-ray metrology solutions for the semiconductor industry, develops, manufactures and sells fully automated metrology tools for advanced technology nodes based on non-contacting and non-destructive tools.The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology tools, based on X-ray technologies such as XRR (X-ray reflectomerty), XRF (X-ray fluorescence), HRXRD (X-ray diffraction) and XRDI (Imaging X-ray diffraction) Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE: CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE: ELRN). With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin Tx, USA, Hsin-Chu Taiwan, Suwon Korea as well as offices and representatives worldwide. For more information: Alon Kapel, Director of Sales & Marketing Jordan Valley Semiconductors Ltd. Tel: +972-4-654-3666 x 134 email@example.com SOURCE Jordan Valley Semiconductors Ltd.