About the JVSensus™ semiconductors production metrology toolThe JVSensus is a fully automated X-ray transmission topography system; enable in-line detection of non visual crystalline defects on patterned or blanket 300mm or 450mm wafers. The system is based on over 15 years of experience in the area of X-ray topography and was designed for fully fab automation and automatic defect detection and classification. The system is based on the 2012 "Best of West" award winner QCTT tool.
Leading Foundry In Asia Has Adopted Jordan Valley's New JVSensus™ Non-visual Crystalline Defect Detection Platform For Sub 20nm Node Process Control
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