ALISO VIEJO, Calif., July 2, 2013 /PRNewswire/ -- Microsemi Corporation (Nasdaq: MSCC), a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today added two new ultra-low dropout (ULDO) linear point-of-load (POL) regulators for space, commercial aviation and defense applications to its radiation-hardened solutions portfolio. The MHL8701 and MHL8705 regulators are the first devices of their kind to include an integrated single event effects (SEE) filter to protect against soft errors caused by heavy ions often found in air- and space-borne applications. The new regulators can also be used with the company's radiation-tolerant SoC and FPGA solutions.
The hermetically sealed regulators are offered with space or military ratings. The new devices are in production and shipping to one of the world's leading space technology companies for a new space bus architecture program.
"Once again, Microsemi has applied its more than 50 years of expertise in developing high-reliability components to deliver an 'industry first' product for aerospace and defense applications," said Durga Peddireddy, director of marketing for Microsemi's High Reliability Products group. "We are building on our success in these segments by leveraging our extensive industry knowledge, coupled with continued product and technology investments, to meet customer needs and deliver high-reliability components and system solutions at an accelerated pace."Microsemi's facility in Massachusetts recently received Laboratory Suitability approval ( http://www.microsemi.com/index.php?option=com_docman&task=doc_download&gid=132073&Itemid=1898) from the Defense Logistics Agency (DLA) for total dose ionization (TID), enhanced low dose radiation sensitivity (ELDRS) and SEE radiation testing in accordance with MIL- STD-883. The MHL8701 and MHL8705 were assembled in a MIL-PRF-38534 certified facility and qualified through the Microsemi Hi-Rel Qualification Level (MHQL TM) program to meet space and military requirements. The devices have attained radiation-performance levels of 300 Krad TID as per Method 1019 and a 100 Krad rating for enhanced low dose rate sensitivity (ELDRS). Single event testing was performed according to ASTM 1192F. Product InformationThe MHL8701 and MHL8705 are optimized for operation at +5 or +3.3 volt (V) inputs with 3A and 5A current rating respectively, and provide an ultra-low dropout of 400 millivolts (mV) at 2 amps with an integrated SEE filter to protect against soft data errors that may occur from subatomic radiation particles commonly found in ground-level and airborne applications. Key features:
- SEE tested to 85 megaelectron-volts (MeV) with no latch-up
- ELDRS tested to 100 Krad, with a powered performance <+/- 5 percent
- Ultra-low dropout voltage: 400mV @ 2.0A
- Maximum thermal resistance: 3.0 degrees C/ W
- DLA Standard Microcircuits Drawing (SMD) qualification in process