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Mentor Graphics Corp. (NASDAQ: MENT) today announced it has expanded the Kronos™
Cell Characterization and Analysis platform to include embedded memories. The
Kronos platform quickly produces accurate performance models for standard cells, I/Os, complex cells and embedded memories within an advanced, integrated environment.
Characterization and analysis of embedded memories poses unique challenges: large circuit size can lead to excessive runtime, complex internal circuitry and a variety of choices available for pin-bus models requires a high level of automation. The Kronos platform addresses these challenges with proven, integrated capabilities.
In managing the characterization and analysis of embedded memories, the Kronos platform delivers ease of configuration that enables an automatic characterization flow. The automated flow runs netlist reduction, all simulations and creates complete .libs. The flow employs fast simulation techniques and precise circuit setup and measurement controls.
Accurate ModelsAt 45nm and below, speed and power consumption are much more sensitive to environmental conditions including voltage and noise. Therefore, producing accurate models at the appropriate conditions is critical to achieving design success. The Kronos platform quickly generates accurate and complete timing/power models and incorporates unique methods for noise immunity and signal integrity to avoid design problems that otherwise might not be detected until failure analysis.
High ThroughputThe Kronos Platform’s advanced algorithms and efficient job distribution reduces characterization time from weeks to days. During characterization, SPICE simulations are continuously monitored, and numerous data checks and recovery mechanisms significantly improve turn-around time by pinpointing specific model results and simulations if a problem is detected. The Kronos technology is tightly integrated to the Mentor®
SPICE simulator providing 3X performance improvement over loose, API type simulator integrations.
“Today many of our customers are trying to perform very exhaustive standard cell characterization across many technologies including analog, flash and CMOS. Some of these organizations are characterizing up to 100 corners,” said Robert Hum, vice president and general manager, Deep Submicron Division (DSM), Mentor Graphics. “By providing leading standard cell characterization and analysis technology deeply integrated with Eldo, our industry leading SPICE simulator, we are helping these customers conduct very thorough characterization while cutting days off their characterization time.”