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Aehr Test Systems And Integrated Service Technology Announce Delivery Of Additional Test Capacity Of ABTS-Pi(TM) High Power, Individual Temperature Control System To IST

FREMONT, Calif., June 6, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, and Integrated Service Technology, Inc. (iST) announced today that Aehr Test has delivered an additional ABTS-Pi Advanced Burn-in and Test System with high power and an individual temperature control system to meet additional capacity needs at iST.

Founded in 1994, iST group, which is headquartered in Hsinchu, Taiwan, is a leading lab-service company, specializing in the development of IC product testing and analysis, failure analysis, debugging, reliability test, and material analysis. Due to the outsourcing trend among large international manufacturers, iST has also taken on the role of an independent quality testing laboratory for brand-name companies' outsourced products and has been certified by Motorola, Dell, Cisco, and Delphi. iST is now one of the top laboratories in the world.

iST is adding the high power and individual temperature control capacity to their existing installed base of ABTS systems at their Taiwan facility. iST also has an installed base of ABTS systems at their Shanghai facility.

iST group has expanded its operations to Beijing, Shanghai, Shenzhen, Kansan, Japan and Sunnyvale (USA), in order to provide customers with prompt, reliable and high quality technical service.

Kevin Tsui, vice president of Reliability Engineering at iST, states, "The breakthrough in the 28nm process achieved by semiconductor foundries in 2012 has spurred the semiconductor industry supply chain to move toward the even more advanced 20nm process and integrated packaging in 2013. To overcome the problems with service life encountered by IC design houses as the process changes, industry leader iST introduced Aehr Test Systems' ABTS-Pi system for high power burn in of these devices and has recently added capability for testing devices with up to 70-80 Amps per device using this system. The ABTS-Pi system allows for individual device temperature control of the "high-powered" High Temperature Operating Life (HTOL) test that will help IC design houses carry out IC reliability testing for advanced processes in a simpler and more cost-effective manner." 

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