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MIGDAL HA'EMEK, Israel,
March 4, 2013 /PRNewswire/ --
Jordan Valley Semiconductor, a market leader of X-Ray metrology tools, announced today that its QC3
™, a production worthy diffractometer for the compound semiconductor and LED industries, is the winner of CS Industry 2013 metrology, test and measurement award.
™ High-Resolution X-Ray Diffractometer is a true leapfrog technology over the existing X-ray technology within the compound semiconductor market" said Dr.
Paul Ryan, Corporate VP and UK site manager.
The QC3™ boasts more than an order-of-magnitude improvement in performance compared to previous systems, with scans taking seconds rather than minutes or even hours.
The productivity of the QC3
™ is further enhanced by the multi-sample stage that can accommodate up to 20 wafers in a single measurement process, with fully automated alignment, measurement, analysis and reporting, meaning an operator no longer needs to manually interpret and record data. The QC3
Jordan Valley's RADS analysis software to provide fast and accurate structural information from the X-Ray data. The RADS software is recognised as the industry leader in X-Ray analysis software.
These features of the QC3
™ system, coupled with the high data quality and throughput, leads to faster identification of epi excursions and their root causes, increasing yield and profit per wafer. Over 50 systems already shipped and installed in facilities across the world, mainly in
The CS Industry Awards 2013 recognising success and development along the entire value chain of the Compound Semiconductor industry from research to completed device, focusing on the people, processes and products that drive the industry forward. The CS Industry Awards will remind us what is good about the industry - the people who drive it with their technical expertise and customer orientated perspectives. Nominations are open to all companies, individuals and organisations within the CS industry and voting will occur through Compound Semiconductor online and print services.