FREMONT, Calif., Jan. 9, 2013 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for the second quarter of fiscal 2013 ended November 30, 2012.
Net sales were $5.1 million in the second quarter of fiscal 2013, compared with $4.8 million in the first quarter of fiscal 2013. The Company reported a net loss of $0.8 million, or $0.09 per diluted share, in the second quarter of fiscal 2013. This compares to a net loss of $0.3 million, or $0.03 per diluted share, in the first quarter of fiscal 2013.
Commenting on the results of the second quarter of fiscal 2013, Gayn Erickson, President and CEO of Aehr Test Systems, said, "We once again improved our net sales results, reflecting the progress we are continuing to make in addressing new market segments and customers with our ABTS™ and FOX™ product lines. However, our gross margin and bottom line were negatively impacted by a change in product mix during the quarter."Erickson continued, "During the quarter we were pleased to have received acceptances on the first shipments of our new ABTS-P Advanced Burn-in and Test System to three different customers. The new ABTS-P delivers to the test and burn-in market a true per-pin architecture for timing, formats, voltages and all I/O pins more commonly seen in the ATE functional test space. These systems can test devices exceeding 70 watts and can control the test temperature of every device in the chamber individually. This combination is excellent for and is being used for testing and burning-in high performance mobile processors used in smartphones, tablets and other high performance logic devices. "We announced this quarter that we received over $2 million in follow-on production orders for our burn-in and test systems from multiple leading manufacturers of advanced logic integrated circuits for automotive applications," added Erickson. "The automotive space, which continues to be growing, and the advanced logic space represent attractive markets for Aehr Test over the next several years. We also announced a partnership with AllianceATE Consulting Group to add AllianceATE's VelocityCAE software as an option to Aehr Test's burn-in and test systems. This partnership combines the design-to-test capabilities of VelocityCAE with Aehr Test's test technology to help meet the growing needs of the semiconductor industry for design for test needs in both package and wafer level form."