Agilent Technologies Inc. (NYSE:A) today extended its leadership in 802.11ac
WLAN test solutions
with its latest
X-Series signal analyzers
. The software release offers expanded WLAN support to include the emerging 802.11ac standard.
With this release, test engineers will be able to accelerate design verification and measurement of 802.11ac WLAN components and devices in product development and high-throughput manufacturing environments.
The latest WLAN technology, 802.11ac, builds on 802.11n with a wider RF bandwidth (up to 160 MHz), MIMO support and high-density 256-QAM modulation to enable 1-Gbps throughput below 6 GHz for multiple stations. Agilent’s X-Series signal analyzers now support this emerging standard with the release of the two new options for the
N9077A WLAN measurement application
that simplify design verification and speed high-volume manufacturing.
“Designing and testing next-generation wireless components and devices are highly complex and challenging tasks requiring the industry’s best, most up-to-date solutions,” said Jim Curran, marketing manager of Agilent’s Microwave and Communications Division. “Adding support for 802.11ac demonstrates our continued commitment to providing the industry-leading solutions required for successful next-generation wireless testing. It further enhances the unmatched measurement power and versatility of our X-Series signal analyzers, while providing support for the emerging standards that engineers need to design for the future.”
Validating the Latest 802.11ac Designs
In addition to supporting 802.11 a/b/g/n, the N9077A WLAN measurement application now offers one-button 802.11ac testing with a new option (4FP), enabling design verification and validation early in the product-development process.
When combined with Agilent’s highest performance PXA signal analyzer, equipped with analysis bandwidth of 160 MHz (Option B1X), the N9077A with Option 4FP enables engineers to measure the full bandwidth of 802.11ac WLAN signals from 20 to 160 MHz and 80+80 MHz.
Key application measurements include transmit constellation error (EVM), transmit spectrum mask (SEM), spectral flatness and CCDF–all with built-in pass/fail test indicators per IEEE standards.