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July 10, 2012 /PRNewswire/
-- At Semicon West, National Instruments (Nasdaq: NATI) today announced the expansion of its line of PXI SMUs for automated semiconductor test. Ideal for parallel testing of multipin semiconductor DUTs, the new
NI PXIe-4143 SMU offers 600,000 samples per second and four channels – the highest channel density of any
SMU – and expands NI's multichannel
SMU output range to 24 V at 150 mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
"With the new NI PXIe-4143, our
SMU family now gives test engineers DC measurement options for almost any device," said
Ron Wolfe, vice president of semiconductor test at National Instruments. "Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available."
Four SMU channels with up to 600 kS/s sampling rate to measure fast transient responses
Four-quadrant output capability of 24 V at 150 mA, complementing preexisting NI SMU capabilities for sourcing and sinking
Measurement sensitivity of 10 pA
Flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments