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Advantest Corporation (TSE: 6857, NYSE: ATE) today announced that the company received the Best Overall Presentation Award at the 22nd Annual IEEE SWTW (Semiconductor Wafer Test Workshop) for a joint presentation with leading probe card manufacturer Japan Electronic Materials Corporation (JEM).
SWTW 2012 was held June 10 - 13, 2012, in San Diego, CA, USA.
Advantest and JEM’s award-winning presentation—judged the best in a field of 29 entries at SWTW 2012—was entitled “Full Wafer Contact Breakthrough with Ultra-High Pin Count.” The presentation described the two companies’ joint development of technology to enable one touchdown testing, using existing MEMS probe arrays and a new vacuum based system, the Vacuum Probe Contact System (VPCS), in very high-pin count wafer probing applications. The companies have demonstrated successful contact with 300mm wafers and are working to extend the technological breakthrough to 450mm wafers.
The Best Overall Presentation Award from SWTW 2012 underscores the need for test technology to address cost and reliability concerns around very high-pin count wafer probing applications and the transition to 450mm. Advantest and JEM plan to commercialize their new technology for flash memory, DRAM, microcontroller, and SoC wafer test, as well as future 2.5D/3D IC processes.
About the SWTW (Semiconductor Wafer Test Workshop)
The Semiconductor Wafer Test Workshop is sponsored by the IEEE Components, Packaging, and Manufacturing Technology Society. Now in its 22nd year, it remains the industry’s leading probe technology forum, focusing on all aspects of microelectronic wafer and die level testing, and featuring both manufacturer and vendor presentations.
Headquartered in the U.S.A., IEEE (（Institute of Electrical and Electronics Engineers, Inc.） is the world's largest professional association of electrical, electronics, information and communications engineers, with more than 400,000 members in more than 160 countries worldwide.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments. Its leading-edge products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, and 3D imaging analysis tools to the pharmaceutical and transportation industries. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at