Dual Power Booster From Cirrus Logic Triples Speed Performance For Semiconductor And Flat-Panel Display Test Equipment. (Photo: Business Wire)

Cirrus Logic Inc. (Nasdaq: CRUS) is expanding its popular and versatile Apex Precision Power ^® booster product family with a new dual-channel booster amplifier, the PB63. With a 1,000 V/µs slew rate and 1 MHz of power bandwidth, the PB63 accelerates power booster performance 300 percent compared to the company’s previous industry benchmark power booster products. By pairing the economical “double booster” PB63 with one or two low-cost op amps, semiconductor and flat-panel test equipment manufacturers can now realize a combination of improved test equipment efficiency and productivity – in a more cost-optimized solution compared to traditional high-voltage amplifiers.

Dual Power Booster From Cirrus Logic Triples Speed Performance for Semiconductor and Flat-Panel Display Test Equipment. (Photo: Business Wire)

The PB63 features voltage operation of ±20 V to ±75 V and continuous output current drive capability of up to 2 A and is designed to provide both voltage and current gain when paired with a small signal, general purpose operational amplifier. This approach allows the user to optimize the accuracy, off set, input noise and settling time of the composite circuit.

“Through the PB63 booster amplifier, Cirrus Logic delivers the high-voltage performance our customers require, along with a significant speed boost, without having to turn to more expensive amplifier products to get the job done,” said Greg Brennan, vice president and general manager, Cirrus Logic’s Apex Precision Power ^® business unit. “Being able to pair the PB63 with an op amp of their choosing enables a flexible, cost-effective approach that allows OEMs to tailor performance for their applications.”

The dual-channel amplifier design of the PB63 provides added value for high density board designs, such as pattern generators in flat panel display inspection systems, deflection circuitry in semiconductor inspection systems, scientific scanning electron microscopes, piezoelectric drivers in printer heads for industrial ink jet printers, and programmable power supplies in semiconductor automated test equipment.

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