Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control systems and solutions, will host an investor and analyst meeting in New York City on Thursday, March 15, 2012, from approximately 10:00 a.m. to 2:00 p.m. ET. The meeting will focus on Nanometrics’ process control technology, market position and growth strategy.
A webcast of the event will be available on the investor page of Nanometrics’ website at
, and will be archived for a limited time.
Equity research analysts and institutional investors interested in attending the event in person may contact Claire McAdams for registration information.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is