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Feb. 22, 2012 /PRNewswire/ -- LitePoint, a leading provider of wireless test solutions, has released a new test solution designed specifically for Altair Semiconductor's FourGee™-3100/6200 TDD/FDD LTE cellular chipset. LitePoint's IQxstream™ cellular test platform, created in tandem with Altair, is the first to offer complete four-device parallel verification and calibration of the FourGee™-3100/6200 LTE chipset in both TDD and FDD modes. This new solution delivers the highest throughput from a single tester, enabling Altair customers to rapidly get their LTE cellular products into high-volume production, with lower support costs.
"As one of the first chipset companies to offer LTE support for both TDD and FDD, it is essential that our manufacturing partners maintain the ability to easily and efficiently scale up production levels," said
Eran Eshed, co-founder and vice president of Marketing and Business Development for Altair. "The availability of a total test solution from LitePoint enables Altair to engage with more customers, faster, allowing us to address more business opportunities at once. Additionally, LitePoint's local teams help support our customers and partners, getting them into production quickly."
Developing test solutions tailored to specific chipsets is an advantage LitePoint offers its customers. "By partnering with leading chipset companies like Altair, LitePoint has a proven track record of delivering high-throughput, production-ready test solutions. Our approach enables companies to get their chipsets into volume production in less time, and with lower support costs," said
John Lukez, senior director of Marketing for LitePoint.
LitePoint at Mobile World Congress 2012 — Barcelona, SpainFebruary 27 - March 1, 2012 – Hall 2, Booth #2B75LitePoint will be demonstrating the IQxstream and the power of high-volume throughput testing for cellular devices at Mobile World Congress in
February 27 through March 1.