July 11, 2011
Camtek Ltd. (NASDAQ and TASE: CAMT) ("Camtek" or the "Company"), announced today that a leading Semiconductor Manufacturer has selected Xact, Camtek's Advanced Transmission Electron Microscope (TEM) sample preparation solution, enabling material analysis and verification. The system was installed during the second quarter of 2011.
Shrinking feature dimensions and advances in material complexity require a scale of analysis only possible through Scanning Transmission Electron Microscope (STEM) and TEM processes. Sample preparation for the front-end of the line (FEOL) process monitoring and offline failure analysis has become a bottleneck. Existing sample preparation solutions are falling short of meeting the evolving requirements of high resolution and high contrast imaging and analysis. Camtek's
overcomes these limitations by applying its ground-breaking Adaptive Ion Milling (AIM™) technology, and offers negligible artifacts and improved throughput.
, Camtek's Chief Executive Officer, commented, "Our momentum continues through the receipt of an additional strategic order from a leading customer that testifies to the strong technological advantages that we have in this area. This order is another important step in our penetration efforts into the sample preparation market. We believe that over the coming quarters, we will be able to build on this momentum and continue to grow and penetrate new customers with the Xact."
ABOUT CAMTEK LTD.
Camtek Ltd provides automated solutions dedicated for enhancing production processes and yield, enabling our customers new technologies in two industries; Semiconductors and Printed Circuit Board (PCB) & IC Substrates.
Camtek addresses the specific needs of these industries with dedicated solutions based on a wide and advanced platform of technologies including intelligent imaging, image processing, ion milling and digital material deposition. Camtek's solutions range from micro-to-nano by applying its technologies to the industry-specific requirements.