Aehr Test Systems Announces Additional Fox(TM)-15 WaferPak(TM) Orders

FREMONT, Calif., Jan. 6, 2011 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received over $1 million in additional orders for multiple FOX-15 WaferPak cartridges from a leading automotive semiconductor manufacturer. The WaferPak cartridges are scheduled to start shipping during calendar year 2011.

"We are very pleased to have received these additional orders for qualification of wafer level burn-in on additional product lines," said Carl Buck, vice president of marketing and contactor business group at Aehr Test Systems.  "Just as the first product line started with only a few WaferPak cartridges, if these products are qualified with wafer level burn-in and move into production, we would expect that additional WaferPak cartridge capacity may be needed. These new orders suggest that the customer is in the process of expanding the savings and reliability improvements they have achieved with the FOX system."

The FOX-15 full wafer contact burn-in and test system, a member of the FOX family of full wafer contact systems, is most effective for long burn-in applications. Other members of Aehr Test's FOX family of products are focused on full wafer parallel test or short burn-in of products such as flash memory devices, embedded memory devices and microcontrollers.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS™, FOX, and MAX systems and the DiePak ^® carrier. The ABTS system is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com .

Safe Harbor Statement

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the FOX and WaferPak contactor technologies, acceptance by customers of the WaferPak contactors shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC), for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.

CONTACT: Aehr Test Systems
         Carl Buck
         V.P. Marketing and Contactor
         Business Group
         [phone] x381
         
         Financial Relations Board
         Lasse Glassen
         Analyst/Investor Contact
         [phone]