Bosch Selects FDC Solution From PDF Solutions

SAN JOSE, Calif., Dec. 16, 2010 (GLOBE NEWSWIRE) -- PDF Solutions, Inc. (Nasdaq:PDFS), the leading provider of yield improvement technologies and services for the integrated circuit (IC) manufacturing process life cycle, today announced that the world leader of automotive, industrial, consumer goods and building Technologies Robert Bosch GmbH has selected its maestria® Fault Detection and Classification (FDC) as FDC solution for its eight-inch new semiconductor facility in Reutlingen, Germany. PDF Solutions will bring to Bosch its worldwide experience and knowledge to deploy its maestria® FDC tool across the whole facility and enable Bosch to receive the full benefit of the implementation of this Advanced Process Control solution for each wafer process step.

"After benchmarking the current market offers and testing a real implementation of maestria® in our Reutlingen facility, we drew the conclusion that maestria® is the best adapted FDC solution to our fabrication environment," said Thorsten Widmer, Vice President of semiconductor plant at Robert Bosch GmbH. "Deploying this powerful tool at fab wide level will help ensure the highest level of process control and even more product quality excellence to our demanding customers," he said.

"We are starting an exciting collaboration with Bosch to support them improving their process efficiency," stated Dr. John Kibarian, CEO at PDF Solutions. "Efficient equipment control requires deep knowledge and experience in integration and connection of equipment to the fab information network, the ability to collect data from different sources (e.g., sensors, manufacturing execution system), and complex mathematical data analysis to detect in real time any process abnormal variation; our offering aims to provide our customers with the most advanced and comprehensive tool to provide strong return on investment." The PDF Solutions maestria® FDC tool focuses on real-time (on-line) detection of manufacturing equipment parameter excursion and also provides valuable data for further analysis. The data is collected, analyzed and stored in a mixed architecture: distributed for local efficient fault detection, and centralized for fab wide data consolidation and correlation with other product data.

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